Anomalous X-Ray Scattering for Materials Characterization by Yoshio Waseda

By Yoshio Waseda

The evolution of our knowing of so much houses of latest sensible fabrics is said to our wisdom in their atomic-scale constitution. To extra this, numerous X-ray and neutron ideas are hired. The anomalous X-ray scattering (AXS) technique, exploiting the so-called anomalous dispersion influence close to the absorption fringe of the constituent point, is among the strongest tools for choosing the exact partial constitution features of person pairs of materials or the environmental features round particular components in multicomponent platforms. AXS turns out to be useful for either crystalline and non-crystalline platforms, for reports of floor and bulk fabrics. This publication is the 1st in this new approach to structural characterization. It describes the fundamentals and alertness rules, and in addition treats the specifics of software to liquid alloys, supercooled beverages, strategies, metal glasses, oxide glasses, superconducting ionic glasses and so on.

Show description

Read Online or Download Anomalous X-Ray Scattering for Materials Characterization (Springer Tracts in Modern Physics) PDF

Best crystallography books

Principles of Protein X-Ray Crystallography

X-ray crystallography has lengthy been a necessary procedure for learning the constitution of proteins and different macromolecules. because the significance of proteins maintains to develop, in fields from biochemistry and biophysics to pharmaceutical improvement and biotechnology, many researchers have came upon wisdom of X-ray diffraction is an crucial instrument.

Science of Crystal Structures: Highlights in Crystallography

A quantity such as entries on quasicrystals, icosahedral packing, different packing concerns, prolonged constructions, information therapy and information mining is gifted by way of luminaries from the crystallography neighborhood. a number of of the contributions are from the colleges of such trend-setting crystallographers as J.

Additional resources for Anomalous X-Ray Scattering for Materials Characterization (Springer Tracts in Modern Physics)

Example text

K. C. O. , A 36, 436 (1980) 24, 25 4. Y. Waseda: Novel Application of Anomalous X-ray Scattering for Structural Characterization of Disordered Materials (Springer, Heidelberg, Berlin, New York 1984) 24, 32 5. jp/ 25 6. C. K. Smith and Q. Johnson: J. Appl. , 18, 8 (1985) 26, 27 7. G. Wood, L. Nicholls and G. Brown: J. Appl. , 19, 371 (1986) 26 8. K. Sugiyama, A. Shikida, Y. Waseda, J. M. Toguri: Shigen-to-Sozai, 106, 485 (1990) 28 9. II,III and IV (Reidel, Dordrecht 1985) 28 10. K. Shinoda, K. Sugiyama, C.

Kro´ o and J. Tak´ acs: J. Non-Cryst. Solids, 45, 1773 (1978) 33 23. P. Phys. , 5, L175 (1975) 33 24. H. K. Warburton and A. Non-Cryst. Solids, 35/36, 1223 (1980) 33 25. C. H. Tonnerre and D. Raoux: J. Non-Cryst. Solids, 106, 38 (1988) 33 26. Y. Waseda and S. Tamaki: Philos. , 32, 951 (1975) 33 38 3. Nature of Anomalous X-ray Scattering 27. F. K. Warburton and L. Wilson: J. Chem. , 87, 604 (1987) 33 28. P. , A 30, 470 (1974) 33 29. Y. Waseda, K. Sugiyama, E. Matsubara and K. Harada: Mater. Trans.

3. Anomalous dispersion factors of Cs measured by the single-crystal diffraction measurement (circles) and calculation (dashed lines) near the LIII absorption edge [3] Accelerator Research Organization, Tsukuba, Japan [5]. At this facility, the energies of interest can be tuned, for example, by using a Si(111) doublecrystal monochromator with an optimum energy resolution of about 5 eV at 10 keV. The effect of the higher harmonics of the Si(333) reflection is usually reduced by intentionally de-tuning the second Si crystal monochromator with a piezo-electric crystal device, although about one-fifth of the intensity of the first-order reflection is lost.

Download PDF sample

Rated 4.90 of 5 – based on 18 votes